deep-level transient spectroscopy

Alternatively, the time response of the capacitance can be used directly, as in deep-level transient spectroscopy.

Subsequently, he published a paper on the analysis of constant-capacitance deep-level transient spectroscopy by negative feedback theory in 1982.

Deep-level transient spectroscopy (DLTS)

Deep-level transient spectroscopy (DLTS) is an experimental tool for studying electrically active defects (known as charge carrier traps) in semiconductors.

By analyzing the speed at which the capacitance responds to changes in voltage, it is possible to obtain information about dopants and other defects, a technique known as deep-level transient spectroscopy.